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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

Bushnell, Michael L

Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits - New Delhi Springer 2005 - xviii,690

E

Dewey Class. No.: 621.395/Bus/Agr

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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits