edited by Miron Abramovici ,Melvin A. Breuer ,Arthur D. Friedman <br/><br/>
Digital systems testing and testable design 

 - Jaico publ., Mumbai  2001 
 - xviii,652p 
<br/><br/><label>ISBN: </label>81-7224-891-1 
<br/><br/><label>Subjects--Facted Index Terms: </label><br/>Computer Science
<br/><br/><label>Dewey Class. No.: </label>621.3815 Abr