Hurst, Stanley L <br/><br/>
VLSI testing : digital and mixed analogue/digital techniques 

 - The Institution of Electrical Engineers, London  1998 
 - xx,532p 
<br/><br/><label>ISBN: </label>0-85296-901-5 
<br/><br/><label>Subjects--Facted Index Terms: </label><br/>Computer Science
<br/><br/><label>Dewey Class. No.: </label>006.31 Hur