Bushnell, Michael L <br/><br/>
Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits 

 - New Delhi  Springer  2005 
 - xviii,690 
<br/><br/>
<br/><br/><br/>E 
<br/><br/><label>Dewey Class. No.: </label>621.395/Bus/Agr