000 00416nam a2200169Ia 4500
100 _aAbramovici, Miron ; Breuer, Melvin A ; Friedman, Arthur D (eds.)
080 _a621.3815
080 _bAbr/
526 _dNTB
526 _aUG
366 _f0%
942 _cBK
245 _aDigital systems testing and testable design
260 _aJaico publishing house
_bMumbai
_c2014
300 _axviii,652
546 _aE
999 _c54825
_d54825