000 00317nam a2200157Ia 4500
082 _a530.8/Ben
100 _aBentley, John P
526 _dNTB
526 _aPG
366 _f20
942 _cBK
245 _aPrinciples of measurement systems
260 _aChennai
_bPearson
_c2006
300 _a480
546 _aE
999 _c78612
_d78612