000 00385nam a2200157Ia 4500
082 _a621.395/Bus/Agr
100 _aBushnell, Michael L
526 _dTB
526 _aPG
366 _f20
942 _cBK
245 _aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits
260 _aNew Delhi
_bSpringer
_c2005
300 _axviii,690
546 _aE
999 _c79047
_d79047